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Table 3 Test application time comparison results

From: A new test set compression scheme for circular scan

Circuits

#ff

#SC = 64

#SC = 128

#SC = 256

[14]

[17]

Pro.

[14]

[17]

Pro.

[14]

[17]

Pro.

s13207

669

51.2

70.3

72.62

64.1

73.7

74.68

66.2

80.3

82.65

s15850

597

31.5

50.6

53.76

38.0

65.4

65.95

43.8

67.1

68.09

s25932

1728

9.6

44.7

46.32

15.1

68.9

70.35

17.8

72.5

74.07

s38417

1636

30.3

50.6

53.70

35.8

56.4

58.61

43.4

63.2

65.61

s38417

1452

31.7

59.4

60.82

43.3

65.1

66.03

51.6

73.6

75.14