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Table 3 Test application time comparison results

From: A new test set compression scheme for circular scan

Circuits #ff #SC = 64 #SC = 128 #SC = 256
[14] [17] Pro. [14] [17] Pro. [14] [17] Pro.
s13207 669 51.2 70.3 72.62 64.1 73.7 74.68 66.2 80.3 82.65
s15850 597 31.5 50.6 53.76 38.0 65.4 65.95 43.8 67.1 68.09
s25932 1728 9.6 44.7 46.32 15.1 68.9 70.35 17.8 72.5 74.07
s38417 1636 30.3 50.6 53.70 35.8 56.4 58.61 43.4 63.2 65.61
s38417 1452 31.7 59.4 60.82 43.3 65.1 66.03 51.6 73.6 75.14