EURASIP Journal on Embedded Systems

Table 2 Test cases description.

From: A Systematic Development Methodology for Mixed-Mode Behavioral Models of In-Vehicle Embedded Electronic Systems

Test no.	Description	Simulation period
Test 1	TxD dominant clamp timeout	1.1 ms
Test 2	Vio undervoltage timeout	12.3 ms
Test 3	Loop delay TxD-CANBus_RxD	14.0 s
Test 4	Hoping states	133.1 s
Test 5	Short circuits	210.1 s
Test 6	Local and remote wake-up	670.1 s
Test 7	Power-On detection	10.5 ms

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